NIST/ITL StRD 
Dataset Name:   SiRstv     (SiRstv.dat)


File Format:    ASCII
                Certified Values   (lines 41 to 47)
                Data               (lines 61 to 85) 


Procedure:      Analysis of Variance


Reference:      Ehrstein, James and Croarkin, M. Carroll.
                Unpublished NIST dataset.


Data:           1 Factor
                5 Treatments
                5  Replicates/Cell
                25 Observations
                3 Constant Leading Digits
                Lower Level of Difficulty
                Observed Data


Model:          6 Parameters (mu,tau_1, ... , tau_5)
                y_{ij} = mu + tau_i + epsilon_{ij}








Certified Values:

Source of                  Sums of               Mean               
Variation          df      Squares              Squares             F Statistic

Between Instrument  4 5.11462616000000E-02 1.27865654000000E-02 1.18046237440255E+00
Within Instrument  20 2.16636560000000E-01 1.08318280000000E-02

                   Certified R-Squared 1.90999039051129E-01

                   Certified Residual
                   Standard Deviation  1.04076068334656E-01












Data:  Instrument   Resistance
           1         196.3052
           1         196.1240
           1         196.1890
           1         196.2569
           1         196.3403
           2         196.3042
           2         196.3825
           2         196.1669
           2         196.3257
           2         196.0422
           3         196.1303
           3         196.2005
           3         196.2889
           3         196.0343
           3         196.1811
           4         196.2795
           4         196.1748
           4         196.1494
           4         196.1485
           4         195.9885
           5         196.2119
           5         196.1051
           5         196.1850
           5         196.0052
           5         196.2090